JPH0125341Y2 - - Google Patents

Info

Publication number
JPH0125341Y2
JPH0125341Y2 JP1983007446U JP744683U JPH0125341Y2 JP H0125341 Y2 JPH0125341 Y2 JP H0125341Y2 JP 1983007446 U JP1983007446 U JP 1983007446U JP 744683 U JP744683 U JP 744683U JP H0125341 Y2 JPH0125341 Y2 JP H0125341Y2
Authority
JP
Japan
Prior art keywords
contact
contacts
insulators
tester
bottom plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983007446U
Other languages
English (en)
Japanese (ja)
Other versions
JPS59113777U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP744683U priority Critical patent/JPS59113777U/ja
Publication of JPS59113777U publication Critical patent/JPS59113777U/ja
Application granted granted Critical
Publication of JPH0125341Y2 publication Critical patent/JPH0125341Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP744683U 1983-01-21 1983-01-21 Ｉｃ試験器用接触装置 Granted JPS59113777U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP744683U JPS59113777U (ja) 1983-01-21 1983-01-21 Ｉｃ試験器用接触装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP744683U JPS59113777U (ja) 1983-01-21 1983-01-21 Ｉｃ試験器用接触装置

Publications (2)

Publication Number Publication Date
JPS59113777U JPS59113777U (ja) 1984-08-01
JPH0125341Y2 true JPH0125341Y2 (en]) 1989-07-28

Family

ID=30138977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP744683U Granted JPS59113777U (ja) 1983-01-21 1983-01-21 Ｉｃ試験器用接触装置

Country Status (1)

Country Link
JP (1) JPS59113777U (en])

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55177657U (en]) * 1979-06-08 1980-12-19

Also Published As

Publication number Publication date
JPS59113777U (ja) 1984-08-01

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